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Sudarshan Bahukudumbi
Sudarshan Bahukudumbi is a quality and reliability test engineer at Intel Corporation. He has written several articles in peer-reviewed journals and is a frequent presenter at industry conferences. He holds an M.S. and Ph.D. in electrical engineering from New Mexico University and Duke University, respectively.
Sudarshan Bahukudumbi
's Books
Displaying items 1 - 1 of 1
Wafer-Level Testing and Test During Burn-In for Integrated Circuits
Published:
28/02/2010
ISBN:
9781596939905
eBook
Price:
£62.00
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