Description
Due to the spectacular growth of electronic systems and the steady demand for new services with increased functionality, the development of more efficient measurement techniques has become of paramount importance. This practical resource details the cutting-edge Modulated Scatterer Technique, which offers you a low-invasive and rapid method for testing and measuring systems and equipment used in a wide range of electronic engineering applications. The book helps you understand how devices and antennas operate, see how signals travel along connecting lines, determine which areas of an antenna are active, and pinpoint where radiation takes place. It teaches you how to locate current electric field concentrations that might produce hot spots or breakdown in devices and antennas, and helps you detect where fields are particularly low. You learn how to reduce electromagnetic interference, determine far field patterns of large antennas for satellite and space communications, and observe penetrable materials to detect faults and make non-invasive measurements. Extensively referenced with 125 illustrations and 100 equations.
Table Of Contents
Preface. Foreword.; Introduction - Where Near Field Measurements Are Useful. Near Field Basics. Direct And Indirect Measurements. Modulated Scatterer Technique. Some Field Maps.; Basic Scatterer Electromagnetics -Introduction. Principle Of Modulated Scattering. Scattering Matrix Formulation. Probe Response In Various Situations. Calculation Of The Probe Response. Free Space Measurements. Application With Different Kinds Of Probes; Mobile probe setups - Low Invasiveness. Sensitivity. Spatial Resolution. Optical Analogy with Near-Field Microscopy. Probe Interaction with Its Environment. Examples of Applications.; Probe Arrays - Minimizing the Duration of the Measurements. Specific Difficulties Associated with Probe Arrays. The Modulated Scattering Approach to Probe Arrays (Retina, Collector). Different Probe Array Arrangements (Reflection, Transmission) Different Modulation Schemes (Series, Parallel). Modulated Vs Standard Probe Arrays. Examples of Applications.; Conclusion .List of Symbols and Notations. Appendices.;
Author
-
Jean-Charles Bolomey
Jean-Charles Bolomey is the director of the Service of Electromagnetism at SUPELEC and a professor at the University of Paris, where he received his Ph.D for a thesis on resonant scattering. He created the Technical Applications Society for Microwave Imagery (SATIMO).
-
Fred E. Gardiol
Fred E. Gardiol has retired from his position of professor and director at the Laboratory of Electromagnetism and Acoustics (LEMA) of the Swiss Federal Institute of Technology (EPFL). He holds a M.S. in electrical engineering from the Massachusetts Institute of Technology and a Ph.D. in applied science from the Catholic University of Louvain, Belgium.