Yield and Reliability in Microwave Circuit and System Design

Yield and Reliability in Microwave Circuit and System Design

Copyright: 1993
 Pages: 294
 ISBN: 9780890065273

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Description
Oriented toward practical aspects of the microwave statistical design problem, this book shows you methods for extending the currently used design methodology in order to design inù reliability and manufacturability. It introduces you to statistical circuit design techniques that encompass many different applications. The text concentrates on the problem of maximizing parametric yield. To verify the methods discussed it presents the results of three case studies using actual fabricated designs.
Table Of Contents
Introduction. Yield. Calculating Yield. Statistical Sensitivity. Yield Optimization. Statistical Modeling. Case Studies and Examples. Case Study 1 - .5 to 2.5 GHz MMIC Gain Block. Case Study 2 - 7 to 11 GHz Low Noise MMIC Amplifier. Balanced LNA Module. Case Study 3 - 7 to 11 GHz MMIC High Power Amplifier. Example 1 - Satellite Communications System. Conclusions. References.

Author

  • Michael Meehan
  • John Purviance