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Iddq Testing for CMOS VLSI

Iddq Testing for CMOS VLSI

By (author): Rochit Rajsuman
Copyright: 1994
Pages: 193
ISBN: 9780890067260

Print Book £43.00 Qty:
1 units available
This book discusses in detail the correlation between physical defects and logic faults, and shows you how Iddq testing locates these defects. The book provides planning guidelines and optimization methods and is illustrated with numerous examples ranging from simple circuits to extensive case studies.
Introduction to Current Testing. Test Generation for Iddq Testing. Manufacturability and Use in Production. Current Testing Techniques. Case Studies With Iddq Testing. Summary and Suggestions.
  • Rochit Rajsuman Rochit Rajsuman manages test research at Advantest America R & D Center in Santa Clara, California. He received his B.Tech. in Electrical Engineering from K.N. Institute of Technology, India, his M.S. in Electrical Engineering from the University of Oklahoma, and his Ph.D. in Electrical Engineering from Colorado State University. He is a senior member of the IEEE and a Golden Core member of the Computer Society.
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