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Testing High-Speed Digital Interfaces with Automated Test Equipment

Testing High-Speed Digital Interfaces with Automated Test Equipment

By (author)s: Jose Moreira, Hubert Werkmann
Copyright: 2010
Pages: 588
ISBN: 9781607839842

eBook £101.00
Providing a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses at advanced ATE topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches.
Introduction - Characterization and Design Verification. Production Testing. Accuracy and Correlation. The ATE Test Fixture. The Future. ; High-Speed Digital Basics - High-Speed Digital Signaling. Time and Frequency Domains. Bit Error Rate. Jitter. Classification of High-Speed I/O Interfaces. Hardware Building Blocks and Concepts. ; High-Speed Interface Standards - PCI Express. HyperTransport. XDR DRAM. GDDR SDRAM. Other High-Speed Digital Interface Standards. ; ATE Instrumentation for Digital Applications - Digital Pin Electronics ATE Card. Sampler/Digitizer ATE Card. Parametric Measurements with Sampled Data. Power Supplies. ; Tests and Measurements - Bit and Pattern Alignment. Functional Test. Shmoo Tests. Fundamental Driver Tests. Driver Jitter Tests. Fundamental Receiver Tests. Receiver Jitter Tolerance. PLL Characterization. Other Tests. Measurement Errors. ; Production Testing - Golden Device. System Level Test. Instrument-Based Testing: At-Speed ATE. Instrument-Based Testing: Low-Speed ATE. Instrument-Based Testing: Bench Instrumentation. Active Test Fixture. Multisite Testing. ; Support Instrumentation - Oscilloscopes. Bit Error Rate Tester. Time Interval Analyzer. Spectrum Analyzer. Vector Network Analyzer. Arbitrary Waveform and Function Generators. Noise Generators. Sinusoidal Clock Sources. Connecting Bench Instrumentation to an ATE System. Coaxial Cables and Connectors. Accessories. ; Test Fixture Design - Test Fixtures. High-Speed Design Effects. Impedance Controlled Routing. Via Transitions. DUT BGA Ballout. Sockets. Relays. Bidirectional Layout. Wafer Probing. Stack-Up. Power Distribution Network. ; Advanced ATE Topics - ATE Specifications and Calibration. Multiplexing of ATE Channels. Focus Calibration. Testing of High-Speed Bidirectional Interfaces with a Dual Transmission Line Approach. Including the DUT Receiver Data Recovery in Driver Tests. Protocol Awareness and Protocol-Based Testing. Testing Multilevel Interfaces with Standard Digital ATE Pin Electronics. Signal Path Characterization and Compensation. ATE DC Level Adjustments. ; Appendices. About the Authors. Index ;
  • Jose Moreira Jose Moreira has extensive experience in the ATE industry, where he has held several positions at Agilent Technologies and Verigy. He is currently a senior engineer at Verigy R&D in Boeblingen, Germany. He has also submitted several patents and published multiple papers in the areas of ATE high-speed digital testing, jitter testing, test fixture design, and focus calibration. Mr. Moreira received an M.S. in electrical and computer engineering from the Instituto Superior TÈcnico of the Technical University of Lisbon. He is a senior member of the IEEE.
  • Hubert Werkmann Hubert Werkmann is a principal consultant at Verigy Germany GmbH. He has over 20 years of experience in the semiconductor design and test industry with various positions at IMS Chips, Agilent Technologies, and Verigy. Dr. Werkmann has multiple published papers in the areas of scan-based design for testability and ATE high-speed testing of computation and memory devices. Dr. Werkmann received a Diploma degree in computer science and a Ph.D. in engineering from the University of Stuttgart, Germany.
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